Roughness Tester PCE-RT 2200
- 21 measurement parameters: Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry (JIS), Rz (JIS), RP (ASME), Rpm (ASME), Rv (ASME), R3z, R3zmax, Rz1max, Rmr (c), Rdc, Rmr
- Large graphic OLED display
- Memory: 20 measurement histories with all parameters
- USB interface
- Display for the position of the probe
The portable and user-friendly roughness tester PCE-RT 2200 from Dhanbad Instruments, equipped with a large OLED display, is ideal for quick and precise measurements in both workshops and laboratories. This roughness meter employs a DSP chip for high-speed control and data processing while maintaining low energy consumption. It offers a wide range of measurement parameters, including Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry (JIS), Rz (JIS), RP (ASME), Rpm (ASME), Rv (ASME), R3z, R3zmax, Rz1max, Rmr(c), Rdc, and Rmr.
Measurements are automatically stored in the internal memory of the roughness meter. These stored data can be transferred to a PC via the micro-USB interface and analyzed using the provided software. Additionally, the data can be displayed on the OLED screen after each measurement, with the option to show the wave profile as well.
For cases where the contact surface of the test piece is too small for proper positioning, the roughness meter includes a positioning adapter. This feature enables accurate measurements on small samples, ensuring the device’s versatility and reliability in various applications.
| Parameter | Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc, Rmax, Ry(JIS), |
| Rz(JIS), RP(ASME), Rpm(ASME), Rv(ASME), | |
| R3z, R3zmax, Rz1max, Rmr(c), Rdc, Rmr | |
| Measuring range | Ra, Rq, Rc: 0.005 … 16 µm |
| Rsm: 5 … 1000 µm | |
| Rsk: -1 … 1 | |
| Rz, Rt, Rp, Rv, Rmax, Ry(JIS), Rz(JIS),RP(ASME), | |
| Rpm(ASME), Rv(ASME), R3z, R3zmax, Rz1max, | |
| Rdc: 0.02 … 200 µm Rmr(c), Rmr: 0 … 100 % | |
| Probe tip radius | 5 µm |
| Probe tip material | diamond, 90° angled |
| Max.recommended force | 4 mN (0.4 gf) |
| with static measurement | |
| Measuring principle | inductive |
| Radius of the longitudinal guide rail | 45 mm |
| Standards | ANSIB46.1/ASMEB46.1 (DIN EN ISO 4287) |
| Maximum travel distance | 15 mm |
| Cut off wavelength | 0.25 mm / 0.8 mm / 2.5 mm |
| Scanning speed | 0.135 mm/s at cutoff wavelength: 0.25 mm |
| 0.5 mm/s at cutoff wavelength: 0.8 mm | |
| 1 mm/s at cut-off wavelength: 2.5 mm | |
| Return speed: 1 mm/s | |
| Memory | 20 measurement runs with all parameters |
| Measurement accuracy | <±10 % |
| Repeatability | <6 % |
| Display | OLED |
| Units | μm / μinch (switchable) |
| Interface | Micro USB |
| Power supply | rechargeable Li-ion battery |
1 x Roughness Tester PCE-RT 2200
1 x Micro probe
1 x Protective cap for probe
1 x Positioning device
1 x Calibration plate
1 x Roughness standard
1 x USB cable
1 x Charging adapter
1 x Carrying case
1 x Instruction manual
